THIN FILM CHARACTERIZATION TECHNIQUES – A REVIEW

Abstract

This paper discuss a review of the different characterization techniques used for optimising the quality of the thin films. XRD gives the average crystallite size, lattice parameters, stress, and strain of the thin film samples which helps to understand the quality of the thin films. UV-Visible analysis study helps to understand the optical band gap, and the transmittance value of the prepared thin films. Ellipsometry helps to deduce the optical constants and to analyse the dielectric behaviour of the prepared thin films. Raman spectroscopy gives the rotational and vibrational modes of the thin films.